Release of JSM-F100
Release of a New Schottky Field Emission Scanning Electron Microscope JSM-F100 The next level of analytical intelligence in FE-SEM for combining high resolution and operability JEOL Ltd. (President & COO Izumi Oi) announces the release of a new Schottky field emission scanning electron microscope, JSM-F100, to be released in August 2019. https://www.jeol.co.jp/en/news/detail/20190804.3456.html
Release of JEM-ARM300F2 (GRAND ARM™2)
Release of a New Ultrahigh Atomic Resolution Analytical Electron Microscope JEOL Ltd. (President & COO Izumi Oi) announces the release of a new atomic resolution analytical electron microscope, JEM-ARM300F2 (GRAND ARM™2) to be released in February 2020. Product development background In Electron Microscopy, a great number of microscopists and engineers have continued to pursue the […]