jsm-f100-newsrelease_20190805

Release of JSM-F100

Release of a New Schottky Field Emission Scanning Electron Microscope JSM-F100

The next level of analytical intelligence in FE-SEM for combining high resolution and operability

JEOL Ltd. (President & COO Izumi Oi) announces the release of a new Schottky field emission scanning electron microscope, JSM-F100, to be released in August 2019.

https://www.jeol.co.jp/en/news/detail/20190804.3456.html

Μετάβαση στο περιεχόμενο