Release of JSM-F100

Release of a New Schottky Field Emission Scanning Electron Microscope JSM-F100

The next level of analytical intelligence in FE-SEM for combining high resolution and operability

JEOL Ltd. (President & COO Izumi Oi) announces the release of a new Schottky field emission scanning electron microscope, JSM-F100, to be released in August 2019.


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