JSM-IT700HR InTouchScope™

Introducing the JSM-IT700HR InTouchScope™, JEOL’s advanced Schottky Field Emission Scanning Electron Microscope (SEM) designed to provide exceptional high-resolution imaging and precise analytical capabilities. With a maximum probe current of 300 nA, this SEM allows for in-depth analysis and observations. Its user-friendly interface simplifies operations, enabling both routine and complex tasks to be performed with ease. The JSM-IT700HR’s compact design incorporates a large specimen chamber, anti-vibrational support, and high-performance features, making it ideal for a wide range of applications.

Key Features:

• High Resolution Imaging: Offers a spatial resolution of 1.0 nm at 20 kV in high vacuum mode and 1.8 nm at 15 kV in low vacuum mode, providing detailed surface morphology.
• Maximum Probe Current: 300 nA for in-depth and high-contrast analysis.
• Large Specimen Chamber: Supports various analyses with ample space and multiple accessory ports.
• Accelerating Voltage:5 to 30 kV, offering flexibility in imaging.
• Zeromag Function: Seamlessly transitions from optical to SEM imaging, improving workflow efficiency.
• Display Magnification: Up to ×1,679,449 for highly detailed imaging.

Specifications:

• Resolution:
  • High vacuum mode: 1.0 nm at 20 kV, 3.0 nm at 1.0 kV
  • Low vacuum mode: 1.8 nm at 15 kV (using Backscattered Electron Detector)
• Accelerating Voltage:5 to 30 kV
• Magnification:
  • Direct magnification: ×5 to ×600,000 (print size 128 mm × 96 mm)
  • Display magnification: ×14 to ×1,679,449 (display size 358 mm × 269 mm)

The JSM-IT700HR offers high-end SEM performance in a compact, easy-to-use package, making it perfect for advanced research in material science, nanotechnology, and beyond.

For more details, please visit the official JEOL website.