JSM-IT200 InTouchScope™

Introducing the JSM-IT200 InTouchScope™, an advanced scanning electron microscope (SEM) designed to streamline observation, analysis, and reporting processes.

Key Features:

• Specimen Exchange Navi: This user-friendly feature guides operators through each step, from sample loading to area selection and SEM image observation, ensuring efficient workflow.
• Zeromag Function: Allows seamless transitions from optical to SEM imaging, enabling users to quickly locate and analyze areas of interest.
• Live Analysis: Provides real-time elemental analysis during observation, delivering immediate insights into sample composition.
• SMILE VIEW™ Lab: Facilitates the generation of comprehensive reports by integrating observation and analysis results, enhancing documentation efficiency.

Specifications:

• Resolution:
  • High vacuum mode: 3.0 nm at 30 kV, 8 nm at 3 kV, 15.0 nm at 1.0 kV.
  • Low vacuum mode: 4.0 nm at 30 kV (using Backscattered Electron Detector).
• Accelerating Voltage:5 to 30 kV.
• Magnification:
  • Direct magnification: ×5 to ×300,000 (print size 128 mm × 96 mm).
  • Display magnification: ×14 to ×839,724 (display size 358 mm × 269 mm).

The JSM-IT200 InTouchScope™ is engineered to provide high-resolution imaging and rapid analysis in a compact design, making it an ideal solution for laboratories seeking advanced SEM capabilities with user-friendly operation.

For more detailed information, please visit the official JEOL website.