JEM-F200

The JEM-F200 is a field emission transmission electron microscope, which features higher spatial resolution and analytical performance coupled with intuitive user interface for multi-purpose operation.

The JEM-F200 offers a cold field-emission electron gun, which guarantees high stability, high brightness, and high energy resolution (<0.33 eV).
This electron gun effectively achieves higher-resolution imaging by minimizing chromatic aberrations originating from the energy spread of the electron source.

For further information about its features, visit JEOL website.