The JSM-7610FPlus successfully integrates a full set of detectors for secondary electrons, backscattered electrons, EDS, WDS, STEM, EBSD, CL, and more. It is a top-of-the-line SEM for semiconductors, nanotechnology, material science, lithography, and compositional and structural analysis.
The JSM-IT200 InTouchScope™ SEM Series are compact, versatile Scanning Electron Microscopes that provide great value with the functionality you’d only expect from high end SEMs.
The JSM-IT700HR InTouchScope™ Field Emission SEM is a compact, versatile Field Emission SEM that offers Smart-Flexible-Powerful performance at a great value.
Ultra High Resolution Field Emission SEM