SolidSpec-3700i/3700iDUV

The SolidSpec-3700i/3700i DUV is equipped with three advanced detectors, enabling seamless measurements from the ultraviolet (UV) to the near-infrared (NIR) spectrum. This system offers unparalleled sensitivity, accuracy, and versatility, meeting the stringent requirements of optical component analysis.

Key Features

High Sensitivity Across a Broad Spectrum

The photomultiplier tube (PMT) detector ensures high sensitivity in the UV and visible regions. The InGaAs detector bridges the gap between 700 nm and 1000 nm, while the cooled PbS detector extends sensitivity into the NIR region, up to 1800 nm. This unique configuration allows highly sensitive measurements, even in traditionally challenging switchover regions.

Wide Measurement Range

The SolidSpec-3700i DUV offers exceptional versatility with a standard measurable range of 175 nm to 2600 nm. When paired with the optional Direct Detection Unit (DDU-DUV), this range extends to 165 nm–3300 nm, encompassing deep ultraviolet to near-infrared regions. This makes it ideal for advanced applications such as laser machining and deep UV optical component evaluation.

Innovative Nitrogen Gas Purge System

To mitigate interference from oxygen molecules that absorb UV light below 190 nm, the SolidSpec-3700i DUV incorporates purge inlets for both the optical and sample compartments. This efficient nitrogen gas purging reduces downtime and ensures accurate, high-sensitivity measurements in the deep UV region.

Materials for Deep UV Performance

The system is designed with specialized materials to enhance deep UV measurements. The PMT detector features fused silica as its window material, while the integrating sphere is constructed with a highly reflective resin, ensuring optimal performance in the deep UV range.

Large Sample Compartment for Non-Destructive Analysis

The SolidSpec-3700i/3700i DUV boasts a large sample compartment, accommodating samples up to 700W × 560D × 40H mm, with a measurable area of 310 × 310 mm when equipped with the optional Automatic X-Y Stage. The three-dimensional optical path allows non-destructive measurements of large samples without the need for resizing.

Versatile Accessories for Expanded Applications

• Direct Detection Unit (DDU-DUV): Enables direct measurement of liquid and solid samples without an integrating sphere, extending the measurable range to 165 nm.
• Automatic X-Y Stage: Facilitates automated measurements for pre-specified points, maintaining nitrogen purge integrity.
• Specular Reflectance Attachments: Supports absolute and relative reflectance measurements, broadening the application range.

Applications Across Diverse Industries

Optical Components

• High-precision transmittance and reflectance measurements
• Evaluation of multilayer films, mirrors, and beam splitters

Materials Science

• Analysis of thin films, functional materials, and semiconductors
• Near-infrared spectroscopy for organic solvents

Pharmaceuticals and Life Sciences

• UV screening, moisture analysis, and quantitation of amino acids, proteins, and nucleic acids

Industrial Applications

• Non-destructive testing of large samples for construction and transportation industries
• Evaluation of coatings, plastics, and textiles

For further information about the SolidSpec-3700i/3700i DUV, visit the official Shimadzu website.