The NeoScan N80 is a scientific-grade X-ray micro-CT scanner engineered to deliver the highest spatial resolution in the NeoScan portfolio. Designed for cutting-edge research and advanced material characterization, the N80 provides sub-micron pixel size, exceptional low-contrast performance, and the ability to resolve fine internal structures that are beyond the reach of conventional micro-CT systems.
With a powerful transmission-target X-ray source up to 110 kV, advanced artefact suppression, and optional phase-contrast retrieval, the NeoScan N80 is the ideal solution for demanding applications in geology, composites, biology, dental research, electronics, and materials science—where maximum resolution, accuracy, and stability are critical.
Key Features & Advantages
🎯 Sub-Micron Resolution & Phase-Contrast Capability
- Pixel size at maximum magnification: < 0.3 µm (CMOS), < 1.2 µm (flat-panel)
- True low-contrast 3D resolution: 2 µm
- Approximately 15× better 3D resolution compared to micro-CT systems using 5 µm source spot sizes
- Optional phase-contrast retrieval for enhanced visualization of weakly absorbing materials
Enables visualization of ultra-fine structures in fibers, biological samples, geological formations and micro-electronic components.
🔦 High-Energy, Ultra-Fine Focus X-Ray Source
- Sealed, maintenance-free transmission target tube
- Smallest focal spot size: 2 µm
- Voltage range: up to 110 kV
- Maximum power: 16 W
- Automatic filter changer with 20 positions
Supports a wide range of materials—from low-density biological samples to dense composites, minerals and electronic assemblies.
📷 Dual Detector Flexibility for Ultimate Performance
The NeoScan N80 can be configured with:
- 21 MP CMOS camera for ultimate resolution and phase contrast
- 7 MP flat-panel detector for larger field-of-view and faster scans
Field of view:
- Flat-panel: 140 × 120 mm
- CMOS: 72 × 48 mm
All detectors are protected against radiation-induced damage for long-term stability.
📦 Large Sample Capacity for a Scientific-Grade System
Despite its ultra-high resolution, the N80 supports generous sample dimensions:
- Maximum scanning diameter: 85 mm (CMOS) / 100 mm (flat-panel)
- Maximum scanning length: 180 mm
- Maximum physical object length: 220 mm
This makes the system suitable for both micro-scale and meso-scale investigations.
🧠 Precision Mechanics & Advanced Image Stability
- Integrated micro-positioning stage for nanometric alignment accuracy
- Active artefact suppression for high-fidelity reconstructions
- Shielded feedthroughs for user cables, sensors or fluid lines
- Interfaces for optional in-situ stages (mechanical, thermal, environmental)
Designed for complex experimental workflows and long-duration research projects.
🛡️ Safety, Reliability & Long-Term Performance
- Fully shielded system for safe operation in laboratory environments
- Maintenance-free X-ray source minimizes downtime
- Robust mechanical and electronic architecture ensures reproducibility over time
📊 Technical Specifications (Overview)
General
- Pixel size at max. magnification: <0.3 µm (CMOS) / <1.2 µm (FP)
- True low-contrast 3D resolution: 2 µm
- scanning diameter: 85 mm (CMOS) / 100 mm (FP)
- scanning length: 180 mm
- physical sample length: 220 mm
- Dimensions: 1200 (W) × 640 (D) × 520 (H) mm
- Weight: 225 kg
- Integrated micro-positioning & artefact suppression
X-Ray Source
- Sealed transmission-target tube
- focal spot size: 2 µm
- Voltage: up to 110 kV
- Power: 16 W
- Automatic 20-position filter changer
X-Ray Detectors
- 21 MP CMOS or 7 MP flat-panel detector
- Field of view (FP / CMOS): 140 × 120 mm / 72 × 48 mm
- Radiation damage protection included
🧪 Typical Applications
The NeoScan N80 is ideally suited for:
- Carbon fibers and fiber-reinforced composites
- Glass fibers and advanced materials
- Geological samples (carbonate reservoirs, shale)
- Biological specimens (insects, bone microstructure)
- Dental research
- Electronics and micro-components
- Advanced academic and industrial research
✔ Why Choose the NeoScan N80?
- Highest spatial resolution in the NeoScan micro-CT lineup
- Sub-micron imaging with optional phase contrast
- Superior low-contrast performance (2 µm true 3D resolution)
- Flexible detector configurations for diverse research needs
- High-energy capability up to 110 kV
- In-situ experiment ready
- Built on decades of micro-CT innovation and expertise
📌 For detailed configurations, optional modules, software capabilities and application examples, please visit the official NeoScan N80 product page.
