Atomic Force Microscope for Optical Microscopes
The Nanosurf LensAFM is an atomic force microscope that picks up where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can also be used to analyze various physical properties of a measurement sample.
For further information about its features, visit Nanosurf’s official website.
