JXA-iSP100

The JEOL JXA-iSP100 Electron Probe Microanalyzer (EPMA) is a state-of-the-art instrument designed to streamline microanalysis processes, enabling users to efficiently observe and analyze defined regions of interest. Incorporating advanced automation and user-friendly features, the JXA-iSP100 ensures that both novice and experienced users can achieve high-quality results with ease.

Automated Specimen Handling and Navigation

The JXA-iSP100 features an automated specimen exchange airlock equipped with an integrated color stage navigation camera mounted on the roof. This design allows users to insert specimens and acquire optical images of the specimen holder with a single click, facilitating quick identification of target observation points. The system’s stage navigation image enables users to select analysis fields directly, enhancing workflow efficiency.

Simplified Operation with Auto Functions

To ensure that users can obtain high-quality scanning electron microscope (SEM) images effortlessly, the JXA-iSP100 is equipped with optimized auto functions for image adjustment. The integration of real-time energy-dispersive X-ray spectroscopy (EDS) allows for elemental screening during observation. The “Easy EPMA” feature simplifies elemental analysis by providing a streamlined instrument setting, making the process accessible even to those new to EPMA technology.

Enhanced Analytical Capabilities

The JXA-iSP100 is designed with high expandability to accommodate a variety of detectors, such as soft X-ray emission spectrometers (SXES), crystal orientation analysis systems (electron backscatter diffraction or EBSD), and cathodoluminescence (CL) detectors. This adaptability allows the instrument to serve diverse analytical purposes, providing comprehensive data for various research needs.

Efficient Maintenance and Calibration

To maintain optimal performance, the JXA-iSP100 includes a self-maintenance notification function that alerts users when routine maintenance is required. The instrument also features efficient calibration capabilities, utilizing built-in standard specimens to streamline the calibration process and reduce the potential for user error. These features ensure that the EPMA system remains in peak condition, minimizing downtime and maximizing productivity.

Key Specifications

• Electron Source: Equipped with a tungsten (W) filament electron probe, the JXA-iSP100 ensures precise and accurate analysis.
• Detectors: The system includes five wavelength dispersive X-ray spectrometers (WDS) and one energy-dispersive X-ray spectrometer (EDS), allowing for comprehensive elemental analysis with high precision and sensitivity.
• Resolution: The JXA-iSP100 achieves a secondary electron image resolution of 6 nm with a tungsten filament and 5 nm with a lanthanum hexaboride (LaB₆) filament at a working distance of 11 mm and an accelerating voltage of 30 kV.
• Accelerating Voltage: The instrument operates within a range of 0.2 to 30 kV, adjustable in 0.1 kV steps, providing flexibility for various analytical requirements.
• Probe Current Range: The JXA-iSP100 supports a probe current range from 10⁻¹² to 10⁻⁵ A, accommodating a wide array of analytical scenarios.

For more detailed information and inquiries, please visit the official JEOL website.