JXA-iHP200F

The JEOL JXA-iHP200F Field Emission Electron Probe Microanalyzer (FE-EPMA) is a state-of-the-art instrument designed to streamline microanalysis processes, enabling users to efficiently observe and analyze defined regions of interest. Incorporating advanced automation and user-friendly features, the JXA-iHP200F ensures that both novice and experienced users can achieve high-quality results with ease.

Automated Sample Handling and Navigation

The JXA-iHP200F features an automated specimen exchange airlock equipped with an integrated color stage navigation camera mounted on the roof. This design allows users to insert samples and acquire optical images of the specimen holder with a single click, facilitating rapid identification of target observation points. The system’s stage navigation image enables users to select analysis fields directly, enhancing workflow efficiency.

Simplified and Automated Operations

To ensure users can effortlessly obtain high-quality scanning electron microscope (SEM) images, the JXA-iHP200F is equipped with optimized automatic functions for image setting. The integration of real-time energy-dispersive X-ray spectroscopy (EDS) allows for elemental screening during observation. The “Easy EPMA” function simplifies elemental analysis by providing streamlined instrument settings, making the process accessible even to those new to EPMA technology.

Enhanced Analytical Capabilities

The JXA-iHP200F is designed with high expandability to accommodate a variety of detectors, such as soft X-ray emission spectrometers (SXES), crystal orientation analysis systems (electron backscatter diffraction or EBSD), and cathodoluminescence detectors (CL). This adaptability allows the instrument to serve diverse analytical purposes, providing comprehensive data for various research needs.

Efficient Maintenance and Calibration

To maintain optimal performance, the JXA-iHP200F includes a self-maintenance notification function that alerts users when routine maintenance is required. The instrument also features efficient calibration capabilities, utilizing 18 built-in standard specimens to streamline the calibration process and reduce the likelihood of user error. These features ensure that the EPMA system remains in peak condition, minimizing downtime and maximizing productivity.

In-Lens Schottky Plus Field Emission Gun

The JXA-iHP200F is equipped with an in-lens Schottky Plus field emission gun (FEG), providing high resolution at low accelerating voltages. This enables high spatial-resolution SEM imaging and analysis at high magnifications. Thermionic emission guns, which achieve large probe currents with high stability over long periods, are suitable for fast trace-element analysis and for overnight analysis of multiple specimens.

Key Specifications

• Electron Source: The JXA-iHP200F is equipped with a Schottky field emission electron source, ensuring high-resolution imaging and analysis.
• Detectors: The system includes five wavelength-dispersive spectrometers (WDS) and an integrated energy-dispersive X-ray spectroscopy (EDS) detector, enabling comprehensive elemental analysis with high accuracy and sensitivity.
• Cathodoluminescence Detection: An integrated panchromatic cathodoluminescence (CL) detector is included, providing additional analytical capabilities.
• Accelerating Voltage: The instrument operates up to 30 kV, providing flexibility for various analytical requirements.

For more detailed information and inquiries, please visit the official JEOL website.