JSM-IT810

The JSM-IT810 from JEOL combines exceptional versatility, high spatial resolution, and advanced automation, making it one of the most user-friendly FE-SEMs available today. Designed to streamline workflows and enhance productivity, the JSM-IT810 is the perfect tool for both novice and experienced SEM operators.

Key Features

• Automated Imaging and EDS Analysis: The no-coding automation feature enables seamless imaging and energy dispersive spectroscopy (EDS) analysis, ensuring a streamlined and efficient workflow.
• SEM Automatic Adjustment Package: Automatically optimizes key parameters such as alignment, focus, and astigmatism correction, simplifying complex tasks for users.
• Trapezoidal Correction Function: Ideal for electron backscatter diffraction (EBSD) measurements, ensuring accurate and reliable results.
• Live 3D Surface Reconstruction: Provides real-time visualization of surface topography, enabling detailed analysis of material textures and structures.
• High Spatial Resolution: Delivers outstanding imaging performance, capturing fine details with precision and clarity.

Specifications

• Electron Gun: Schottky Field Emission Electron Gun for stable, high-brightness performance.
• Resolution:
  • High Vacuum Mode: 1.0 nm at 20 kV, 1.2 nm at 15 kV.
  • Low Vacuum Mode: 1.4 nm at 20 kV (using Backscattered Electron Detector).
• Accelerating Voltage:1 to 30 kV.
• Magnification:
  • Direct: ×10 to ×1,000,000.
  • Display: ×25 to ×3,000,000.
• Stage: 5-axis motorized specimen stage for efficient and flexible analysis.

The JSM-IT810 offers a seamless blend of high-resolution imaging, automated functionality, and advanced features that cater to the needs of modern research and industrial applications. Whether you are studying materials science, nanotechnology, or conducting failure analysis, this FE-SEM provides unparalleled performance and ease of use.

For more information, visit the official JEOL website.