JSM-IT800

The JSM-IT800 is JEOL’s cutting-edge Schottky Field Emission Scanning Electron Microscope (SEM), designed to deliver unparalleled imaging resolution, speed, and versatility. Equipped with advanced features and innovative technology, the JSM-IT800 offers a seamless blend of high-resolution observation and high-speed elemental mapping, catering to the diverse needs of scientific and industrial users.

Key Features:

• SEM Center Platform: An intuitive graphical user interface (GUI) serving as a unified platform for high-resolution imaging and elemental analysis. It simplifies operations and enhances user productivity.
• JEOL In-Lens Schottky Plus Field Emission Electron Gun: Ensures stable, high-brightness electron beams for superior imaging and analysis performance.
• Neo Engine Control System: The next-generation electron optical control system ensures precision and flexibility in observation and analysis.
• Objective Lens Configurations: Five distinct versions tailored for different applications:
  • Hybrid Lens (HL): A general-purpose FE-SEM for versatile use.
  • Super Hybrid Lens (SHL) Versions: Optimized for ultra-low accelerating voltages and highest-resolution imaging.
  • Semi-In-Lens (i/is) Versions: Specialized for semiconductor device observation and analysis.
• Advanced Detectors:
  • Scintillator Backscattered Electron Detector (SBED): Delivers excellent material contrast imaging, even at low accelerating voltages.
  • Versatile Backscattered Electron Detector (VBED): Provides 3D compositional and material contrast imaging.

Specifications:

• Resolution:
  • HL:7 nm (20 kV), 1.3 nm (1 kV)
  • SHL:5 nm (15 kV), 0.7 nm (1 kV)
  • SHLs:6 nm (15 kV), 1.1 nm (1 kV)
  • i:5 nm (15 kV), 0.7 nm (1 kV)
  • is:6 nm (15 kV), 1.0 nm (1 kV)
• Accelerating Voltage:01 to 30 kV
• Magnification:
  • Direct: ×10 to ×2,000,000 (HL/SHL/SHLs), ×25 to ×2,000,000 (i/is)
  • Display: ×27 to ×5,480,000 (1,280 × 960 pixels, all versions)

The JSM-IT800 is ideal for applications in material science, nanotechnology, semiconductor research, and more. Its customizable configurations, advanced automation, and superior resolution make it the ultimate tool for high-performance SEM imaging and analysis.

For more details, visit the official JEOL website.