JSM-IT710HR

Introducing the JSM-IT710HR, JEOL’s fourth-generation high-resolution (HR) Scanning Electron Microscope (SEM), designed to make high-resolution imaging accessible to all users. This advanced SEM simplifies operation with enhanced automatic functions and improved observation capabilities, encouraging users to explore beyond previous limitations.

Key Features:

• Enhanced Electron Gun Stability: The Schottky Field Emission electron gun stability has been improved more than four times compared to previous models, ensuring consistent and reliable imaging performance.
• Automatic Beam Adjustment: The JSM-IT710HR eliminates the need for complex manual adjustments by providing automatic alignment, astigmatism correction, and focusing, allowing users to obtain optimal imaging conditions effortlessly.
• Low-Vacuum Hybrid Secondary Electron Detector (LHSED): This detector collects both electron and photon signals, providing images with high signal-to-noise ratio and enhanced topographic information, even under low vacuum conditions.
• 5-Axis Motor-Controlled Specimen Stage: The standard 5-axis motorized stage facilitates convenient SEM image acquisition of uneven specimens and efficient Energy Dispersive Spectroscopy (EDS) analysis.

Specifications:

• Resolution:
  • High vacuum mode: 1.0 nm at 20 kV, 3.0 nm at 1.0 kV
  • Low vacuum mode: 1.8 nm at 15 kV (using Backscattered Electron Detector)
• Accelerating Voltage:5 to 30 kV
• Magnification:
  • Direct magnification: ×5 to ×600,000 (print size of 128 mm × 96 mm)
  • Display magnification: ×14 to ×1,679,449 (display size of 358 mm × 269 mm)

The JSM-IT710HR is ideal for researchers and professionals seeking an SEM that combines high-resolution imaging with user-friendly operation. Its advanced automation and enhanced performance features make it suitable for a wide range of applications, including materials science, nanotechnology, and biological research.

For more detailed information, please visit the official JEOL website.