JSM-IT510 InTouchScope™

Introducing the JSM-IT510 InTouchScope™, the highest-end model in JEOL’s thermionic-emission scanning electron microscope (SEM) series, designed for advanced, high-resolution imaging and analysis. This SEM combines cutting-edge features with exceptional ease of use, providing a seamless experience for both routine and complex observations. The new Simple SEM function allows users to automate daily routines, saving time and enhancing operational efficiency.

Key Features:

• Simple SEM Function: Automates routine tasks, enabling users to focus on higher-level analyses and improving overall workflow efficiency.
• Large Multi-Purpose Chamber: Features a spacious chamber with a 200 mm diameter, allowing for simultaneous multi-modal analyses and enhancing flexibility in experimentation.
• High-Resolution Imaging: Provides ultra-high resolution with a performance of 3.0 nm at 30 kV in high vacuum mode and 4.0 nm at 30 kV in low vacuum mode, delivering detailed surface morphology and precise analysis.
• Multiple Observation Modes: Capable of operating in both high and low vacuum modes for a broad range of sample types, including non-conductive materials.

Specifications:

• Resolution:
  • High vacuum mode: 3.0 nm at 30 kV, 15.0 nm at 1.0 kV.
  • Low vacuum mode: 4.0 nm at 30 kV (using Backscattered Electron Detector).
• Accelerating Voltage: 0.3 to 30 kV.
• Magnification:
  • Direct magnification: ×5 to ×300,000 (print size of 128 mm × 96 mm).
  • Display magnification: ×14 to ×839,724 (display size of 358 mm × 269 mm).

The JSM-IT510 InTouchScope™ is designed for laboratories that demand exceptional SEM capabilities, offering high-quality imaging, flexibility, and advanced automation. Whether used for routine materials analysis or complex research tasks, the JSM-IT510 is the ideal tool for achieving superior results in a variety of scientific and industrial applications.

For more information, please visit the official JEOL website.