JSM-IT210

Introducing the JSM-IT210, JEOL’s most compact stationary scanning electron microscope (SEM), designed to deliver high-performance imaging and analysis in a space-saving design. Equipped with a newly developed motor-driven stage, it offers precise and efficient five-axis movement, enhancing user safety and operational speed.

Key Features:

• Motor-Driven Five-Axis Stage: Facilitates precise and rapid positioning of samples, improving workflow efficiency.
• Simple SEM Function: Automates observation and analysis by selecting the desired field of view, enabling unattended operation and consistent results.
• High-Resolution Imaging: Delivers detailed surface morphology with a resolution of 3.0 nm at 30 kV in high vacuum mode.

Specifications:

• Resolution:
  • High vacuum mode: 3.0 nm at 30 kV.
  • Low vacuum mode: 4.0 nm at 30 kV (using Backscattered Electron Detector).
• Accelerating Voltage:3 to 30 kV.
• Magnification:
  • Direct magnification: ×5 to ×300,000 (print size of 128 mm × 96 mm).
  • Display magnification: ×14 to ×839,724 (display size of 358 mm × 269 mm).

The JSM-IT210 is an ideal solution for laboratories seeking advanced SEM capabilities with user-friendly operation and minimal space requirements. Its combination of automated features and high-resolution imaging makes it suitable for a wide range of applications, from materials science to biological research.

For more detailed information, please visit the official JEOL website.