Photoelectron Spectrometer (XPS)
The JPS-9030 is a multi-purpose XPS adopting newly-developed software for greater ease-of-use. A new Kaufman-type etching ion source is installed in the specimen exchange chamber to prevent contamination of the measurement chamber. In addition to the standard Mg/Al twin anode, an infrared heating system and an Ar gas cluster ion source are available.
For further information about its features, visit JEOL official website.
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