JIB-PS500i

The JEOL JIB-PS500i represents the cutting edge of Focused Ion Beam-Scanning Electron Microscope (FIB-SEM) technology. Combining high-resolution imaging and high-performance FIB capabilities, the JIB-PS500i is designed for accurate and high-quality specimen preparation, particularly for TEM analysis. This state-of-the-art system supports advanced research and industrial applications, offering precise material characterization and sample processing.

Key Features:

• High-Resolution SEM Imaging:

Achieves exceptional resolution with 0.7 nm at 15 kV, 1.4 nm at 1 kV, and 1.0 nm at 1 kV in BD mode, enabling detailed observation of fine structures.

• High-Performance FIB System:

Delivers a resolution of 3 nm at 30 kV and a probe current range of 1 pA to 100 nA, ensuring precise milling and sample preparation.

• Large Specimen Stage:

Equipped with a highly adjustable stage featuring large tilt angles, facilitating the preparation of TEM specimens and trimming specimen blocks with ease.

• Double-Tilt Cartridge:

Enables seamless specimen transfer to the TEM without replacing the TEM grid, ensuring efficiency and reducing handling errors.

• Streamlined Workflow:

The integration of SEM and FIB functionality in a single platform simplifies complex tasks, making it ideal for both routine and advanced research applications.

Specifications:

• SEM Resolution:
  • 7 nm at 15 kV
  • 4 nm at 1 kV
• nm at 1 kV (BD mode)
• FIB Resolution: 3 nm at 30 kV
• FIB Probe Current: 1 pA to 100 nA
• Applications:
  Perfect for TEM specimen preparation, cross-sectional imaging, nano-fabrication, and high-resolution material analysis.

The JIB-PS500i is a versatile and powerful tool for researchers and professionals in materials science, semiconductor research, nanotechnology, and other advanced fields. With its unmatched precision, streamlined operation, and user-friendly design, it ensures optimal results for even the most demanding applications.

For more information, visit the official JEOL website.