JIB-4700F

The JEOL JIB-4700F MultiBeam System combines advanced FIB-SEM technology with cutting-edge features, making it the perfect solution for researchers and professionals requiring high-resolution imaging and fast, precise sample processing. Engineered for speed, accuracy, and versatility, the JIB-4700F is ideal for applications in materials science, semiconductor research, and nanotechnology.

Key Features

1. Hybrid Conical Objective Lens and GENTLEBEAM™ (GB) Mode:

• Guaranteed high-resolution SEM imaging with 1.2 nm at 15 kV (GB mode) and 1.6 nm at 1 kV (GB mode).
• Enables low-voltage operation for delicate sample imaging without compromising quality.

2. In-Lens Schottky FEG:

• Produces an electron beam with a maximum probe current of 300 nA, providing exceptional high-resolution imaging and rapid elemental analyses.

3. High-Performance FIB Column:

• Equipped with a high-current-density Ga ion beam, delivering a maximum probe current of 90 nA for fast and efficient ion milling and sample preparation.
• Offers superior FIB resolution of 4.0 nm at 30 kV.

4. Advanced In-Lens Detector System:

• Ensures precise imaging with enhanced signal-to-noise ratios, supporting detailed observation of complex sample structures.

Specifications

• SEM Image Resolution:
  • 2 nm (15 kV, GB mode)
  • 6 nm (1 kV, GB mode)
• FIB Image Resolution:
  • 0 nm (30 kV)
• FIB Probe Current:
  • Ranges from 1 pA to 90 nA
• Electron Gun:
  • In-Lens Schottky Field Emission Gun with a maximum probe current of 300 nA

Applications

The JIB-4700F MultiBeam System is tailored for advanced research and industrial applications, including:

• Materials Science: High-resolution imaging and surface analysis.
• Nanotechnology: Precise sample fabrication and manipulation.
• Semiconductor Research: Cross-sectional imaging, defect analysis, and circuit editing.
• TEM Specimen Preparation: Fast and accurate milling for high-quality results.

Why Choose the JEOL JIB-4700F?

With its combination of high-resolution imaging, rapid sample processing, and user-friendly design, the JIB-4700F redefines performance standards for FIB-SEM systems. Whether you are conducting advanced research or industrial analysis, this system provides unmatched precision and productivity.

For more detailed information, visit the official JEOL website.