JEM-120i

Transmission Electron Microscope (TEM)

The JEM-120i Transmission Electron Microscope (TEM) by JEOL is a state-of-the-art instrument designed to meet the evolving needs of researchers in fields such as biology and polymer science. With a 120 kV accelerating voltage, the JEM-120i offers exceptional imaging capabilities for soft materials, embodying JEOL’s commitment to innovation through its compact design, user-friendly operation, and expandability.

Compact Design

The JEM-120i’s compact footprint marks a significant advancement in TEM design. Its reduced size positions the filament replacement and specimen holder insertion points lower than those in previous models, enhancing accessibility and ergonomics. A newly developed cartridge-type filament unit simplifies and secures the filament replacement process, making it straightforward for any user. Additionally, an LED indicator on the front panel changes color to reflect the microscope’s operational status, allowing users to assess its condition from a distance.

User-Friendly Operation

The JEM-120i streamlines the specimen observation process into four simple steps:

  1. Insert the specimen holder.
  2. Click the Start Button to automatically initiate observation preparations, including voltage increase and emission start.
  3. A wide-area image is captured simultaneously; selecting a target field moves the stage to the chosen position.
  4. Standard “Butler mode” assists in data acquisition, enabling even beginners to capture data effortlessly.

This intuitive workflow minimizes manual intervention, reducing the learning curve for new users and enhancing overall efficiency.

Furthermore, the JEM-120i features an enhanced TEM control system and fully automated apertures, eliminating the need to switch magnification modes or select apertures manually. This innovation facilitates seamless observation across various magnifications, allowing for smoother operations compared to previous models.

Expandability

Designed with future advancements in mind, the JEM-120i supports a variety of retrofits and accommodates additional functions post-purchase. This expandability ensures that the microscope can adapt to evolving research requirements, providing a sustainable and cost-effective solution for laboratories.

Specifications

  • Resolution:2 nm (High Contrast mode), 0.14 nm (High Resolution mode)
  • Accelerating Voltage: 20–120 kV
  • Magnification:
    • 50–1,200,000× (High Contrast mode)
    • 50–1,500,000× (High Resolution mode)
  • Standard Camera: NEOView Camera, 4 MP, 30 fps
  • Optional Camera: SightSKY, 19 MP, 58 fps (cameras from other manufacturers can also be mounted)
  • Dimensions: Width 840 mm, Depth 1,734 mm, Height 1,782 mm

For more detailed information and inquiries, please visit the official JEOL website.

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