JCM-7000 NeoScope™ Benchtop SEM

Introducing the JCM-7000 NeoScope™, a cutting-edge benchtop scanning electron microscope (SEM) designed for seamless navigation and live analysis.

Key Features:

• Zeromag Function: Facilitates smooth transitions from optical to SEM imaging, allowing users to quickly locate areas of interest.
• Live Analysis: Enables real-time elemental analysis during observation, providing immediate insights into sample composition.
• Live 3D Imaging: Offers simultaneous observation of live SEM images and reconstructed 3D surface images, delivering comprehensive topographic and depth information.
• Low Vacuum (LV) Mode: Allows observation of non-conductive specimens without the need for sample preparation, preserving their natural state.
• Stage Navigation System: Assists users in easily locating areas of interest on the sample, enhancing workflow efficiency.

Specifications:

• Direct Magnification: ×10 to ×1,000,000 (defined by 128 mm × 96 mm).
• Monitor Magnification: ×24 to ×202,168 (defined by 280 mm × 210 mm).
• Maximum Specimen Size: 80 mm in diameter.

Optional Features:

• Energy Dispersive X-ray Spectrometer (EDS): For detailed elemental analysis.
• Tilting and Rotating Motor Drive Holder: Enhances sample positioning capabilities.

The JCM-7000 NeoScope™ is engineered to provide high-resolution imaging and analysis in a compact design, making it an ideal solution for laboratories requiring advanced SEM capabilities without the complexity of traditional systems.

For more detailed information, please visit the official JEOL website.