IB-19540CP / IB-19550CCP

The JEOL IB-19540CP Cross Section Polisher™ and IB-19550CCP Cooling Cross Section Polisher™ are advanced instruments designed to prepare high-quality cross sections of specimens for electron microscopy. Utilizing a broad ion beam milling technique, these devices produce pristine cross sections rapidly and with minimal artifacts, making them essential tools for researchers and engineers in materials science, nanotechnology, and related fields.​

Key Features:

• New Graphical User Interface (GUI) and Internet of Things (IoT) Integration: Both models feature an intuitive GUI that simplifies operation through a flowchart-based control panel. Users can easily set up processes by following on-screen prompts. Additionally, preset functions allow for saving and recalling process conditions tailored to specific applications or specimen types. IoT capabilities enable remote access and control via a web browser, facilitating monitoring and adjustments across multiple devices.
• High Throughput Ion Source: Equipped with an optimized ion-source electrode and increased accelerating voltage, the standard milling rate has been enhanced to 1,200 μm/h. This improvement significantly reduces processing time while maintaining high-quality results.
• High Throughput Cooling System (IB-19550CCP): The IB-19550CCP model incorporates a high-efficiency cooling system that allows continuous milling for up to 8 hours at -120°C. This feature is particularly beneficial for thermally sensitive materials, as it minimizes heat-induced damage during the milling process. The system also supports automatic transitions from cooling to room temperature, streamlining workflows and reducing waiting times. ​

Applications:

These Cross Section Polishers™ are ideal for preparing specimens that are challenging to process using traditional mechanical methods. They are particularly effective for:​

• Brittle materials​
• Multilayer coatings with varying hardness or thermal expansion coefficients​
• Fragile porous materials​
• Polymers and composites​

The resulting artifact-free surfaces are suitable for high-resolution imaging and microanalysis techniques such as Energy-Dispersive X-ray Spectroscopy (EDS), Wavelength Dispersive Spectroscopy (WDS), and Electron Backscatter Diffraction (EBSD) when used with Scanning Electron Microscopy (SEM), Electron Probe Microanalysis (EPMA), or Auger electron spectroscopy.

Additional Features:

• User-Friendly Software Interface: The flowchart-style control panel guides users through the setup process step-by-step. Preset functions allow for quick and optimized setup for different specimen types, enhancing usability.
• Milling Monitoring Camera (Optional): An optional milling monitoring camera enables real-time observation and adjustment of the milling process. When connected to a local area network (LAN), users can remotely access and control the system, enhancing flexibility and efficiency.
• Multi-Purpose Stage: The versatile stage design accommodates various sample holder options, including those for large-area milling, planar milling, carbon sputter coating, and air-isolated transfer. Standard holders are compatible with JEOL SEM stages, allowing for direct specimen transfer.
• Air Isolation Workflow (Optional): For specimens sensitive to air exposure, an optional transfer vessel system enables sample mounting in an inert atmosphere (e.g., a glovebox), direct transfer to the Cross Section Polisher™ for milling, and subsequent transfer to a JEOL SEM without atmospheric exposure.

In summary, the JEOL IB-19540CP and IB-19550CCP Cross Section Polishers™ offer advanced capabilities for the preparation of high-quality cross sections, enhancing the accuracy and efficiency of electron microscopy analyses. Their user-friendly interfaces, high throughput features, and adaptability to various specimen types make them invaluable tools in modern materials research laboratories.​

For more detailed information and specifications, please visit the official JEOL website.