IB-19530CP

Cross Section Polisher

The JEOL IB-19530CP Cross Section Polisher™ is an advanced instrument designed for the high-quality preparation of cross-section samples for electron microscopy. Using a broad Ar+ ion beam, the IB-19530CP achieves smooth cross-sections with minimal deformation, surpassing traditional mechanical polishing methods. This makes it an ideal solution for analyzing a wide range of materials, including metals, ceramics, polymers, and composites.

Key Features:

  • High Throughput: Equipped with a high-speed ion source and an auto-start function, the IB-19530CP enables rapid cross-section preparation, significantly reducing processing time.
  • Automated Processing Program: The IB-19530CP features programmable high-speed processing and finishing functions, ensuring the preparation of high-quality cross-sections in a short time. Additionally, an intermittent processing mode minimizes thermal damage to heat-sensitive materials by controlling ion beam irradiation exposure.
  • Easy Setup: The modular holder design allows for precise milling area adjustment either within the IB-19530CP or using an external optical microscope, making sample preparation more efficient.
  • Multi-Purpose Stage: Its innovative multi-purpose stage, in combination with specialized functional holders, enables various functions such as planar surface milling, polishing, and sputter coating, in addition to traditional cross-section ion milling.
  • Durable Shielding Plate: The shielding plate has three times the lifespan of conventional products, providing a higher processing rate and extended durability of the system.

Technical Specifications:

  • Ion Accelerating Voltage: 2 to 8 kV
  • Milling Speed: 500 μm/h or more
  • Maximum Sample Size: 11 mm (W) × 10 mm (L) × 2 mm (T)
  • Sample Swing Function: Automatic swing of the sample during milling (±30°)
  • Auto Start Mode: Milling automatically starts once a preset vacuum pressure is reached
  • Intermittent Mode: Pulse-controlled ion beam irradiation reduces sample exposure
  • Finishing Mode: Fine surface finishing automatically starts after processing

Ideal Applications:

The IB-19530CP Cross Section Polisher™ is designed for the precise preparation of challenging materials that are difficult to process using conventional mechanical techniques. It is particularly effective for:

Brittle materials

Layered coatings with varying hardness or thermal expansion coefficients

Porous or delicate materials

Polymers and composite materials

The high-quality cross-sections produced are suitable for advanced high-resolution imaging and microanalysis techniques, including Energy Dispersive X-ray Spectroscopy (EDS), Wavelength Dispersive Spectroscopy (WDS), and Electron Backscatter Diffraction (EBSD), when used with Scanning Electron Microscopes (SEM), Electron Probe Microanalyzers (EPMA), or Auger spectrometers.

Additional Features:

  • User-Friendly Software Interface: A streamlined control panel guides users through the setup process step by step. Preset functions allow for quick and optimized settings for different sample types, enhancing ease of use.
  • Milling Process Monitoring Camera (Optional): An optional real-time milling monitoring camera allows users to observe and adjust the milling process. When connected to a Local Area Network (LAN), users can access and control the system remotely, increasing flexibility and efficiency.
  • Versatile Sample Holder System: The flexible stage design accommodates a variety of sample holders, including those for large-area milling, flat milling, carbon sputtering, and vacuum-isolated transfer. Standard holders are compatible with JEOL SEM specimen stages, allowing for direct sample transfer.

Conclusion:

The JEOL IB-19530CP Cross Section Polisher™ offers state-of-the-art capabilities for high-quality cross-section preparation, ensuring exceptional accuracy and efficiency in electron microscopy sample analysis. Its user-friendly interface, high-performance features, and adaptability to various sample types make it an invaluable tool for materials science, nanotechnology, and advanced research laboratories.

📌 For more details and full specifications, visit the official JEOL website.

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