IB-19520CCP

The JEOL IB-19520CCP Cross Section Polisher™ is an advanced instrument designed for the precise preparation of high-quality cross-sectional samples for electron microscopy. By utilizing a broad Ar+ ion beam and incorporating a liquid nitrogen cooling system, the IB-19520CCP effectively minimizes thermal damage during the milling process, making it ideal for sensitive materials such as polymers, solders, metallic lithium, and galvanized steel.

Key Features:

• Enhanced Cooling Mechanism: The IB-19520CCP employs a liquid nitrogen cooling system that rapidly cools specimens and maintains temperatures as low as -120°C for over 8 hours. This system is designed to suppress liquid nitrogen consumption, allowing for extended cooling periods without frequent refills.
• Temperature Control Options: An optional temperature control mechanism enables precise regulation of the specimen holder’s temperature, preventing excessive cooling and ensuring optimal milling conditions for various materials.
• Real-Time Process Monitoring: Equipped with a CCD camera, the IB-19520CCP allows users to monitor the milling process in real-time. The magnification can be adjusted, providing detailed observation and control over sample preparation.
• Anti-Static Coating Function: An optional ion beam sputter function is available, enabling the creation of thin, uniform coatings with fine granularity. This feature is particularly beneficial for applications requiring pattern recognition, such as Electron Backscatter Diffraction (EBSD).
• Planar Ion Milling Holder: The instrument includes a holder that irradiates the ion beam at a low angle relative to the sample surface. This design effectively removes surface contamination and smooths the specimen surface, making it ideal for selective etching applications.
• Cross Section Preparation Kit: For specimens prone to streaking during milling, such as porous materials, powders, and fibers, the IB-19520CCP offers a kit that performs ion beam milling while rotating the sample. This approach ensures uniform cross-sections free of artifacts.

Technical Specifications:

• Ion Accelerating Voltage: 2 to 8 kV​
• Ion Beam Width: 500 μm (full width at half maximum)​
• Milling Speed: 500 μm/h (average over 2 hours at 8 kV, using a Si specimen)​
• Specimen Holder Cooling Temperature: Down to -120°C or lower​
• Cooling Duration: Maintains temperature for 8 hours or more​
• Coolant Tank Capacity: Approximately 1 liter​
• Maximum Specimen Size: 11 mm (W) × 8 mm (D) × 3 mm (H)​
• Stage Movement Range: X-axis: ±6 mm; Y-axis: ±2.5 mm​
• Specimen Milling Swing Angle: ±30° (Patent US4557130)​
• Monitoring Camera Magnification: Approximately ×20 to 100 on a 6.5-inch display​
• Air-Isolation System: Utilizes a transfer vessel to prevent air exposure during the transition from polishing to observation​
• Operation Interface: User-friendly touch panel with a 6.5-inch display​
• Gas Requirements: Argon gas with a flow rate controlled by a mass-flow controller​
• Main Evacuation Pump: Turbo molecular pump​
• Auxiliary Evacuation Pump: Rotary pump​
• Dimensions and Weight:
  • Main Unit: Approximately 670 mm (W) × 720 mm (D) × 530 mm (H); Weight: ~73 kg​
  • Rotary Pump: Approximately 120 mm (W) × 288.5 mm (D) × 163 mm (H); Weight: ~9.3 kg​

Optional Accessories:

• Large Specimen Rotation Holder (IB‐11550LSRH): Facilitates milling of larger specimens with rotational capabilities.​
• Mounting Base Specimen Holder (IB‐11560MBSH): Provides stable mounting for various specimen types.​
• Large Specimen Holder (IB-11570LSH): Accommodates larger specimens for versatile applications.​
• Carbon Coating Holder (IB-12510CCH): Enables carbon sputter coating for enhanced sample conductivity.​

Installation Requirements:

• Power Supply: Single-phase 100 to 120V ±10%, 50/60Hz, 0.6KVA​
• Grounding: 100Ω or less​
• Argon Gas: Pressure at 0.15±0.05MPa with purity of 99.9999% or higher
• Environmental Conditions: Room temperature between 15 to 25°C with humidity of 60% or less​

The JEOL IB-19520CCP Cross Section Polisher™ stands out as a state-of-the-art solution for preparing cross-sectional samples with minimal thermal damage, offering unparalleled precision and versatility for a wide range of materials and applications.

For further information about its features, visit the official JEOL website.