CRYO-FIB-SEM

The JEOL CRYO-FIB-SEM is an innovative system designed specifically for the preparation of frozen specimens, particularly for applications requiring high-quality TEM (Transmission Electron Microscopy) specimen preparation. By integrating advanced cryogenic technology with precise FIB-SEM capabilities, this system supports cutting-edge research in fields such as structural biology, biopolymers, and cryogenic material science.

Key Features

1. Cryogenic Stage with Liquid Nitrogen Cooling:

• Maintains frozen specimens at stable cryogenic temperatures, ensuring minimal structural changes and preservation of delicate biological or polymer samples during processing.

1. Cryocooled Specimen Transfer Mechanism:

• Allows seamless handling and transfer of frozen specimens, minimizing exposure to non-cryogenic environments to preserve specimen integrity.

1. Built-In Sputter Coating Functionality:

• Enables an all-in-one workflow, performing a series of crucial steps for TEM specimen preparation directly within the system:
  • Conductivity coating for reducing charging effects.
  • Protective film formation to safeguard specimen surfaces.
  • Precise FIB processing for accurate milling and thinning.

1. Integration with JEOL’s CRYO ARM™ Cartridge:

• Simplifies specimen transfer to the JEOL CRYO ARM™ TEM system, enabling direct and efficient workflows from preparation to analysis.

Advantages of the CRYO-FIB-SEM System

• Efficient TEM Specimen Preparation:

Automates and simplifies complex workflows, ensuring consistent high-quality results.

• Versatility Across Applications:

Ideal for preparing specimens of biopolymers, frozen biological samples, and other cryogenic materials for advanced analysis.

• Precision Processing:

Combines high-resolution imaging and focused ion beam milling for unparalleled accuracy in sample preparation.

Applications

The CRYO-FIB-SEM system is designed for use in a variety of advanced research and industrial applications, including:

• Structural biology for cryo-TEM analysis of macromolecules.
• Biopolymer research, enabling detailed analysis of structural properties.
• Cryogenic material studies for nanotechnology and material science.

Why Choose the JEOL CRYO-FIB-SEM?

With its state-of-the-art cryogenic features, seamless workflow integration, and unmatched precision, the CRYO-FIB-SEM system is the ultimate solution for researchers seeking to push the boundaries of cryogenic electron microscopy and high-resolution sample preparation.

For more information, visit the official JEOL website.