Field Emission Cryo-Electron Microscope
CRYO ARM™ 300 II is a cryo–electron microscope that specializes in the observation of electron beam-sensitive specimens, such as protein, for single particle analysis, tomography and MicroED. This system offers improved stability, throughput and ease of use compared to the previous generation of cryo-EMs. Moreover, this is an all-in-one system that can handle everything from screening to data acquisition, allowing for more flexibility in operation at the customer sites to meet the needs of the facility. These improvements allow users to obtain high quality images by simple operations even for those who have never used an electron microscope before.
For further information about its features, visit Jeol website.