Alphacen 300 Flex

Industrial Atomic Force Microscope

The Alphacen 300 Flex system is a unique AFM solution that can handle large and heavy samples with ease. It features the Flex-Mount scan head, which has a tip-scanner design that enables high-performance imaging regardless of the sample size or weight. The CX controller, Nanosurf’s most advanced AFM controller, offers fast and precise control over the scan process. The dedicated acoustic enclosure reduces external noise and vibrations. Moreover, the system can be further customized with additional translation or rotation axes to suit your specific sample.

No other AFM system offers such versatility and functionality.

  • Tip scanner design ensures high-quality imaging regardless of sample size or weight
  • Samples up to 300 mm x 300 mm and 45 kg
  • A dedicated acoustic enclosure to minimize external noise and vibrations
  • Can serve as basis for custom solutions

For further information about its features, visit Nanosurf’s official website.

Nanosurf Alphacen 300 Flex internal

Skip to content