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Microscopy
X-Ray Microtomography
Transmission Electron Microscopes (TEM)
Scanning Electron Microscopes (SEM)
Auger Microprobe
Electron Probe Microanalyzers (EPMA)
Sample Preparation
Focused Ion Beam Systems (FIB)
Atomic Force Microscopes (AFM)
Electron Beam Lithography Systems
3D NeoSpace Station
Real-Time 3D glasses-free interactive imaging for the most immersive experience
Alphacen 200 Drive
Industrial Atomic Force Microscope
Alphacen 300 Flex
Industrial Atomic Force Microscope
CoreAFM
Atomic Force Microscope for Research
CRYO ARM™ 200
Field Emission Cryo-Electron Microscope
CRYO ARM™ 300
Field Emission Cryo-Electron Microscope
CRYO ARM™ 300 II
Field Emission Cryo-Electron Microscope
CRYO-FIB-SEM
CryoLameller
DriveAFM
Atomic Force Microscope for Research
FlexAFM
Atomic Force Microscope for Research
IB-19520CCP
Cross Section Polisher
IB-19530CP
Cross Section Polisher
IB-19540CP / IB-19550CCP
Cross Section Polisher
JAMP-9510F
Auger Microprobe
JBX-3050MV/S
Variable-Shaped Electron Beam Lithography System
JBX-3200MVS
Variable-Shaped Electron Beam Lithography System
JBX-8100FS Series
Electron Beam Lithography System
JBX-9500FS
100kV Electron Beam Lithography (EBL) System
JBX-A9 Series
Electron Beam Lithography System
JCM-7000 NeoScope™ Benchtop SEM
Benchtop SEM
JEM-120i
Transmission Electron Microscope (TEM)
JEM-1400Flash
Electron Microscope
JEM-2100Plus
Multi-purpose Electron Microscope
JEM-2200FS
Field Emission Electron Microscope
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