ΑΡΧΙΚΗ / Προϊόντα / ΕΠΙΣΤΗΜΟΝΙΚΟΣ ΕΞΟΠΛΙΣΜΟΣ / JSM-F100

JSM-F100

Οίκος:

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Schottky Field Emission Scanning Electron Microscope

Περιγραφή

The JSM-F100 incorporates not only our highly regarded In-lens Schottky Plus field emission electron gun and “Neo Engine” (electron optical control system), but also a new GUI “SEM Center” and an innovative “LIVE-AI (Live Image Visual Enhancer – Artificial Intelligence) filter”.
This enables an optimal combination of high spatial resolution imaging and high operability. Furthermore, the JSM-F100 comes with a JEOL energy dispersive X-ray spectrometer (EDS), which is fully integrated within “SEM Center” for seamless acquisition from images to elemental analysis results.
Inspired by users in pursuing the evolution, and integration, of high performance and operability, the JSM-F100 achieves a superb work efficiency, 50% or higher than that of our previous JSM-7000 series, leading to dramatically increased high throughput capabilities.