ΑΡΧΙΚΗ / Προϊόντα / ΕΠΙΣΤΗΜΟΝΙΚΟΣ ΕΞΟΠΛΙΣΜΟΣ / ΗΛΕΚΤΡΟΝΙΚΗ ΜΙΚΡΟΣΚΟΠΙΑ / ΜΙΚΡΟΣΚΟΠΙΑ TEM / JEM – ARM 300F

JEM – ARM 300F

Οίκος:

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GRAND ARM Atomic Resolution Electron Microscope

Περιγραφή

JEM-ARM300F GRAND ARM is an Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 58 pm.