ΑΡΧΙΚΗ / Προϊόντα / ΕΠΙΣΤΗΜΟΝΙΚΟΣ ΕΞΟΠΛΙΣΜΟΣ / ΗΛΕΚΤΡΟΝΙΚΗ ΜΙΚΡΟΣΚΟΠΙΑ / ΜΙΚΡΟΣΚΟΠΙΑ SEM / JSM – IT200 InTouchScope Scanning Electron Microscope

JSM – IT200 InTouchScope Scanning Electron Microscope

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Περιγραφή

JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScopeTM, with significantly higher throughput.
Specimen Exchange Navi, a beginner-friendly function, offers guided operation from sample loading to area search and SEM image observation. “Zeromag” for seamless transition from optical to SEM imaging, “Live Analysis”*2 for real time display of elemental analysis results, SMILE VIEW Lab for seamless report generation of observation and/or analysis results, etc., provide fast analysis with integrated transition from OM to SEM.

Fast observation, analysis and report generation!

JEOL InTouchScope™ series, the high performance analytical tool with major three functions.