ΑΡΧΙΚΗ / Προϊόντα / ΕΠΙΣΤΗΜΟΝΙΚΟΣ ΕΞΟΠΛΙΣΜΟΣ / ΗΛΕΚΤΡΟΝΙΚΗ ΜΙΚΡΟΣΚΟΠΙΑ / ΜΙΚΡΟΣΚΟΠΙΑ SEM / JSM-7610FPlus

JSM-7610FPlus

Οίκος:

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Schottky Field Emission Scanning Electron Microscope

Περιγραφή

The highly-acclaimed optical system of the JSM-7610F has been updated, achieving even better resolution (15 kV 0.8 nm, 1 kV 1.0nm), and is now available as the JSM-7610FPlus.
The Semi-in lens type objective lens and High Power Optics of the irradiation system deliver high-spatial resolution observation and stable analysis capability.
In addition, the JSM-7610FPlus can be equipped to satisfy a variety of user needs, including observation at low accelerating voltages with GENTLEBEAM™ mode, and signal selection using r-filter.